Microscope Accessories and Replacement Parts
General accessories and parts for use with microscopes. Products include lens oil, lens cleaner, slide dispensers, microscope covers, vessel holders, light cubes, and flow cells.
Many parts of your microscope can be updated or replaced including microscope lamps, lenses, and eyepieces. Replacement lamps, light sources, and power cords can extend the working lives of your microscopy equipment. New or replacement objectives and lenses can help increase the total magnification available with your microscope.
Add greater magnification or exchange your eyepiece for one with a reticule to more easily estimate the sizes of the items being viewed.
Replace or update your mechanical stage or clamps or add cell culture vessel adapters to facilitate specimen positioning.
Condensers can also be replaced, and conversion kits are available to add phase contrast, polarization, fluorescence, or other capabilities to your current system.
Some microscopes can be adapted for use with still or video cameras. Look for cameras and adapters designed for your specific microscope brand. Film and documentation-related products may also be available to support your record-keeping.
Temporary, semi-permanent, and more long-term slide storage options include:
- Slide racks that securely hold slides during staining procedures
- Folding fiberboard or plastic slide holders with horizontal indentations that keep microscope slides in place
- Slide storage boxes with vertical dividers; made from fiberboard, plastic, and wood and available in multiple sizes
- Slide holders and mailers for transporting slides safely
- Slide storage systems and cabinets for large quantities of slides or archival storage
Electron Microscopy Sciences High Resolution Magnification Calibration 150-2DUTC Choose the mount
Model 150-2D is a very high resolution reference and traceable standards for magnification calibration of AFM, SEM, Auger, and FIB. It has a precision, holographic pattern that provides accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements.
The period is 144 nm pitch, two-dimensional array that is accurate to +/- 1 nm (calibration certificate will have actual pitch.) Surface: Aluminum bumps on Silicon, 4x3 mm die. Bump height (about 90 nm) and width (about 75 nm) are not calibrated.
For SEM an independent analytical lab has tested this specimen in a FE-SEM and found that the pattern was very uniform and the specimen was easy to image. No significant charging was observed in the voltage range 1-20 kV. This traceable, Certified Standard is a select grade.
Electron Microscopy Sciences Double Cross Lines Reticle RET 65, 21 mm, 2.0 mm Gap
High quality, precision made standard reticles are manufactured to use with our microscope eyepieces. All recticles are chrome on glass and positive polarity.
Size: 21 mm
Gap: 2.0 mm
Electron Microscopy Sciences Paterson Globes and Circles Graticle NG1, 16mm
The graticule consists of a central rectangle, sub-divided into nine smaller rectangles with a number of increasing circles outside the top and bottom horizontal edges. The marked figures are the diameters of the circles in units. 250 units represent the horizontal length of the large rectangle. Rectangle size is 4.5mm x 2.025mm. Circle sizes in microns are 450, 360, 270, 225,180,145, 110, 74, 37, and 18.
Size: 16 mm
Surface: Glass sandwich
Electron Microscopy Sciences SEM Hitachi Single Mount Storage Tube
A plastic tube and plug for M4 threaded Hitachi mounts. 15 mm in diameter Tube. A 15 mm Hitachi mount can be inserted securely to the plug and then protected by the tube. Ideal for storage as well as mailing. The internal diameter of the tube is 0.83"(21 mm). The Outer measurements of the tube are: 0.9" (23 mm) x2.05” H (52 mm)
Ted Pella Inc FEI, Tescan, ZEISS (also for Philips, LEO, Cambridge, Leica, CamScan), aluminum, grooved edge, Ø25.4mm, 100/pk
FEI, Tescan, ZEISS (also for Philips, LEO, Cambridge, Leica, CamScan), aluminum, grooved edge, Ø25.4mm, 100/pk
Electron Microscopy Sciences Recessed SEM Clamp, 25 x 15 mm, 3.2 mm
Achieve background-free imaging and no contact with sample surface in imaging area with this 5 mm recessed clip. Clamping area is 25 mm (1") long x 15 mm (0.6") wide. Maximum thickness: 7 mm under the clamping strips. Made of machined aluminum with brass screws.
Size: 25 x 15 mm
Pin diameter: 3.2 mm
Electron Microscopy Sciences Pharmaceutical PSA Pattern Graticle G-57, 24.5 mm, Glass sandwich
This graticule was designed for the pharmaceutical industry. However, it is also useful where particle size considerations are restricted to 10 mm and 25 mm. Dots and circles give quick references for these two sizes. In addition a scale is incorporated. The microscope must be calibrated when ordering this graticule, such that the circle must equate to 1 mm on the microscope stage.
Size: 24.5 mm
Surface: Glass sandwich
Electron Microscopy Sciences Grain Sizing Reticle NG61, 27 mm
For the determination of non-metallic inclusion content of steel. NG60 meets EN 10247 and NG61 Meets ISO 4976. Both are scaled for use eith 10x objective magnification Pattern
Size: 27 mm
Method: ISO 4967
Electron Microscopy Sciences Crossed Scale Microscope Graticle NE17, 20.4 mm, 10 mm with 0.1 mm subdivisions
Used as a horizontal and a vertical scale, they are especially useful when interested in measurement in different axis. Crossed micrometer scale.
Size: 20.4 mm
Divisions: 10 mm with 0.1 mm subdivisions
Surface: Chrome image
Electron Microscopy Sciences JEOL SEM Cylinder Mount 2" surface 3- Division, 3/8" height, Aluminum
Cylinder specimen mounts are for use with JEOL scanning electron microscopes. The mounts are made from ultra-pure aluminum with a standard lathe finish.
Head: 2"
Height: 3/8"
Electron Microscopy Sciences EMS Tungsten Loop Filament New, Philips, FEI
Our Electron microscope Tungsten filaments have a rigid attachment of the filament wire to the post with no possiblity of waving and a minimum tip radius for a coherent beam. The base assembly of all of our new filaments are guaranteed to be rebuildable for the lifetime of the electron beam instrument. Inspected for consistent quality and performance before being shipped to you. Return the base and we will rebuild the filament.
Use: Philips, FEI
Electron Microscopy Sciences Maxtaform 150 mesh, Nickel
Maxtaform grids with clean and smooth edges, firm support, and a large open area. 3 mm diameter, 0.75 mil thickness.
Grid: Nickel
Pitch: 165 µm
Hole: 131 µm
Bar: 34 µm
:
Electron Microscopy Sciences Maxtaform 150 mesh, Cu/Rh
Maxtaform grids with clean and smooth edges, firm support, and a large open area. 3 mm diameter, 0.75 mil thickness. Copper grids with one surface coated with inert Rhodium. This coating will eliminate tarnishing, give side identification, and reduce the bar thickness.
Grid: Cu/Rh
Pitch: 165 µm
Hole: 131 µm
Bar: 34 µm
:
Electron Microscopy Sciences MicroMounts™ Crystal Tool with Assortment A1, SPINE pin
MicroMounts are the high performance tools for manipulating and mounting protein crystals, virus crystals, and small molecule/inorganic crystals, and other small, fragile samples. They are ideal for both conventional and high-throughput X-ray crystallography applications.
Each consist of a thin (7.5um thick) micro-fabricated polyimide film, attached to a solid non-magnetic stainless steel pin. Film is wrapped around the steel pin and it provides excellent stiffness and convenient scoop-like action in retrieving and handling crystals. Includes: 10, 20, 30 and 40 um apertures.
Aperture: SPINE pin